INVESTIGATION OF THE ELECTRODEPOSITED ZnS NANOSTRUCTURES BY CHRONOAMPEROMETRY PROCESS: EFFECT OF THE ZINC SULFATE CONCENTRATION
dc.contributor.author | GHEZALI, K. | |
dc.contributor.author | MENTAR, L. | |
dc.contributor.author | BOUDINE, B. | |
dc.contributor.author | AZIZI, A. | |
dc.date.accessioned | 2019-06-02T10:09:14Z | |
dc.date.available | 2019-06-02T10:09:14Z | |
dc.date.issued | 2018-02-05 | |
dc.description | Séminaire National Sur Laser Solaire Et Matériaux ElOeued 5-6 Février 2018 | en_US |
dc.description.abstract | Thin films semiconductor have widely been fabricated and improved to be used in photovoltaic application thanks to their special properties. Zinc sulfide (ZnS) present interesting properties, which give it place in solar cells application as window or buffer layer. ZnS thin films were prepared at room temperature by electrochemical deposition using zinc sulfate and sodium thiosulfate solution at pH 2.7. In this paper, we have investigated the influence of the zinc sulfate concentration on the structural, morphological and, optical properties for the electrodeposited ZnS thin films. SEM images demonstrated that the morphology of ZnS thin films depend greatly on the intial concentration of ZnSO4. XRD studies confirmed the presence of zinc blende structure with the (200) orientation. The optical measurements (UV-Vis) show a large band gap between 3.4 –3.8 eV. | en_US |
dc.identifier.uri | https://dspace.univ-eloued.dz/handle/123456789/2402 | |
dc.language.iso | en | en_US |
dc.publisher | University of Eloued جامعة الوادي | en_US |
dc.subject | XRD; thin films; nanostructures; carrier density. | en_US |
dc.title | INVESTIGATION OF THE ELECTRODEPOSITED ZnS NANOSTRUCTURES BY CHRONOAMPEROMETRY PROCESS: EFFECT OF THE ZINC SULFATE CONCENTRATION | en_US |
dc.type | Other | en_US |
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