Deposition and characterization of n type Lanthanum doped zinc oxide /p cuprous oxide layers

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dc.contributor.authorALLAG Nassiba
dc.contributor.authorBENHAOUA Boubaker
dc.contributor.authorSAIED Chahnez
dc.date.accessioned2024-06-02T13:52:56Z
dc.date.available2024-06-02T13:52:56Z
dc.date.issued2020-02-23
dc.descriptionIntervention
dc.description.abstractIn this study, CuO thin films were deposited by hydrothermal deposition (chemical bath or aqueous solution) methods onto a pure and La doped ZnO substrat and followed by a thermal oxidation constant temperatures at 300ºC to produce an oxide based p n junction. In a pre vious work , the formation and characterizations of pure and La doped ZnO thin film with different Lanthanum concentrations (from 1, to 5 wt %) on glass substrates using spray pyrolysis technique at 375 °C were studied . Our aim is to study and investig ate the effect of CuCl 2 .2H 2 O concentration as precursor, annealing process, and the process time during the deposition, while keeping solution temperature at 65ºC , on the structural, morphological, optical, and electrical properties of the prepared thin fi lms. Characterization of p n junction thin films by X ray diffraction, Scanning electron microscopy ,UV Visble ,FTIR Spectroscopy and photoluminescence, respectively, were performed. The XRD pattern of Cu x O/ZnO exhibits five diffraction peaks (the 34.47° correspond to the (002) direction of ZnO and the others additional two peaks at 2 θ values of around 35.447° and 38.684° which correspond to the (and (002)/ (111) planes of pure monoclinic structure of CuO) CuO).No additional peaks related to other phases such as Cu, Cu(OH)2 or Cu 2 O were detected suggesting that the grown CuO are of high purity The photoluminescence signal of the thin films CuO showed a narrow band gap of (2.1 eV) . The estimated thicknesses of the CuO layer the crystallite sizes were calculate d 69.8 nm .The SEM image indicates that CuO adhere to ZnO s robustly and more stable.
dc.identifier.citationALLAG Nassiba. BENHAOUA Boubaker. SAIED Chahnez. Deposition and characterization of n type Lanthanum doped zinc oxide /p cuprous oxide layers. International PluridisciplinaryPhD Meeting (IPPM’20). 1st Edition, February23-26, 2020. University Of Eloued. [Visited in ../../….]. Available from [copy the link here].
dc.identifier.urihttps://dspace.univ-eloued.dz/handle/123456789/33006
dc.language.isoen
dc.publisherUniversity Of Eloued جامعة الوادي
dc.subjectThin films
dc.subjectXRD Spray pyrolysis
dc.subjectZnO
dc.subjectLa doped Photoluminescence CuO thin films
dc.titleDeposition and characterization of n type Lanthanum doped zinc oxide /p cuprous oxide layers
dc.typeIntervention

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